Keysight announces customized GaN test board for the PD1500A

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Keysight Technologies announced a customized GaN test board for the company’s dynamic power device analyzer/double-pulse tester (PD1500A) that delivers repeatable and reliable device characterization. As a result, Tier 1 and OEM power converter designers can reduce protype cycles and speed introduction of new products to the market.

To deliver consistent, reliable characterization of WBG semiconductors, Keysight developed the PD1500A dynamic power device analyzer platform. This platform is modular, allowing discrete silicon (Si) and silicon carbide (SiC) based power devices to be characterized.

Now with customized GaN test boards, customers are provided with the same repeatable and reliable characterization for these faster switching devices.

GaN is currently only targeting on-board chargers and DC/DC converters in EVs. However, with the advent of vertical GaN, expectations are that operating voltages will catch up with SiC (1.2kVand higher), making GaN a potential for higher power applications in e-Mobility.

Keysight’s measurement science enables a commercially available solution for repeatable and reliable characterization of GaN power devices, accelerating OEM and Tier 1’s ability to introduce competitive EVs to the market.

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